MXenes, the most important identified household of 2D supplies, are identified for his or her sophisticated construction consisting of many various components. Their properties could be finely tuned by exact engineering of the composition of every atomic layer. Thus it’s essential to additional develop the secondary ion mass spectrometry (SIMS) approach which may unambiguously determine every factor with atomic precision. The newly established protocol of deconvolution and calibration of the SIMS knowledge allows layer-by-layer characterization of MAX part and MXene samples with ±1% accuracy. Such precision is especially essential for samples that encompass a number of completely different transition metals of their construction. This confirms that almost all MXenes comprise a considerable quantity of oxygen within the X layers, thus enabling the identification of oxycarbide, oxynitride, and oxycarbonitride subfamilies of those supplies. It will also be utilized for under- and over-etched samples and to find out the precise composition of termination layers. Typically, the SIMS approach could present invaluable help within the synthesis and optimization of MAX part and MXene research.
